by Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher
Reference:
Model-based, mutation-driven test case generation via heuristic-guided branching searchAndreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg WeissenbacherProceedings of the 15th ACM-IEEE International Conference on Formal Methods and Models for System Design, MEMOCODE 2017, Vienna, Austria, September 29 - October 02, 2017 (Jean-Pierre Talpin, Patricia Derler, Klaus Schneider, eds.), pages 56–66, 2017, ACM.
Bibtex Entry:
@InProceedings{DBLP:conf/memocode/FellnerKSTW17,
author = {Andreas Fellner and Willibald Krenn and Rupert Schlick and Thorsten Tarrach and Georg Weissenbacher},
title = {Model-based, mutation-driven test case generation via heuristic-guided branching search},
booktitle = {Proceedings of the 15th {ACM-IEEE} International Conference on Formal Methods and Models for System Design, {MEMOCODE} 2017, Vienna, Austria, September 29 - October 02, 2017},
year = {2017},
editor = {Jean{-}Pierre Talpin and Patricia Derler and Klaus Schneider},
pages = {56--66},
publisher = {{ACM}},
bibsource = {dblp computer science bibliography, https://dblp.org},
biburl = {https://dblp.org/rec/bib/conf/memocode/FellnerKSTW17},
doi = {10.1145/3127041.3127049},
timestamp = {Fri, 29 Sep 2017 12:09:05 +0200},
url = {http://doi.acm.org/10.1145/3127041.3127049},
}